Concept:The Binet-Simon scale is an intelligence test that focuses on measuring a child's overall or general mental abilities, rather than specific talents or skills.
Explanation:This scale was developed by Alfred Binet and Theodore Simon to identify children needing extra help in school.
It includes about
30 problems that test functions like judgment, comprehension, and reasoning.
Binet considered these functions to be the core components of intelligence.
The items are arranged in increasing order of difficulty and were tested on children aged
3 to
11 years.
The scale does not measure speed of response or aptitude in a narrow area.
Instead, it gives an overall measure of a child’s general intellectual ability.
Later, Lewis Terman revised this scale into the Stanford-Binet Intelligence Scale.
The term "intelligence quotient" or IQ was coined by William Stern.
Answer:The correct option is
A. The Binet-Simon scale measures
general mental abilities, not specific ones.